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You searched for: mediatype:texts AND collection:NISTTechNotes AND subject:"Semiconductors--Bibliography."
[texts]Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices (Volume NBS Technical Note 232) - French, Judson C.

Keywords: Semiconductors--Bibliography
Downloads: 129
[texts]Measurement of carrier lifetime in semiconductors - an annotated bibliography covering the period 1949-1967. (Volume NBS Technical Note 465) - Bullis, W. Murray, 1930-
About 300 papers concerned with the measurement and interpretation of carrier lifetime in semiconductors are listed together with key words and a brief comment for each. Eight types of entries are included: Description of Methods, Analysis of Results, S
Keywords: Semiconductors--Bibliography
Downloads: 222
[texts]A bibliography on methods for the measurement of inhomogeneities in semiconductors (1953-1967). (Volume NBS Technical Note 445) - Schafft, Harry A.; Needham, Susan Gayle
About 130 papers which deal with the measurement techniques useful in detecting the type and location of various inhomogeneities, primarily in germanium and silicon, are listed with key words. The types of inhomogeneities considered are those in impurity
Keywords: Semiconductors--Bibliography
Downloads: 54
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